GSI 229.365.00 – Probe Card Interface Board

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GSI 229.365.00 – Probe Card Interface Board

laser repair

laser repair, esi laser, gsi laser

Probing System The M310 is designed to integrate testing of the devices to be trimmed into the system hardware and software. The nature of the instrumentation used for this purpose can vary widely with the intended target device(s), but each testing system depends upon the ability to place test probes onto the target device in a precise manner, and only when needed. This capability is provided through the use of a probe card which is customdesigned2 for the intended target device, and mounted in a motorized framework that raises and lowers it onto the wafer on demand. Figure 3-33 shows the relative positions of the probe frame and probe card as they relate to the laser beam and the forcer assembly (including the chucktop and the target wafer). Figure 3-34 illustrates how the probe card is positioned over the wafer, yet allows the laser to pass through uninterrupted.

In order to minimize the time required to perform maintenance or repairs on your system, it is advisable to maintain a local supply of spare parts.

The quantity and nature of these spare parts is determined by the Periodic Maintenance requirements of the system, and by the number of systems that are installed at your location.

It may also be important to consider the difficulty of shipping components to your location. Spare parts can be ordered either through Specialized Electronic Services. Toll free phone numbers are available. Call Now! You can also email inquiries regarding the availability of spare parts can be addressed to:

Note: When ordering parts such as galvanometers, lasers or expensive optics, consult SES before you consult other vendors. SES has years of experience and will give you the best pricing and service in the industry.

See this GSI Laser product on our Laser Repair site here: GSI Laser